Information for "Ellipsometry"
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Basic information
Display title | Ellipsometry |
Default sort key | Ellipsometry |
Page length (in bytes) | 24,967 |
Namespace ID | 0 |
Page ID | 1177592 |
Page content language | en - English |
Page content model | wikitext |
Indexing by robots | Allowed |
Number of page watchers | 72 |
Number of page watchers who visited in the last 30 days | 4 |
Number of redirects to this page | 2 |
Counted as a content page | Yes |
Wikidata item ID | Q898774 |
Local description | Optical technique for characterizing thin films |
Central description | optical technique for characterizing thin films |
Page image | ![]() |
Page views in the past 30 days |
Page protection
Edit | Allow all users (no expiry set) |
Move | Allow all users (no expiry set) |
Edit history
Page creator | 132.206.205.83 (talk) |
Date of page creation | 23:53, 16 November 2004 |
Latest editor | Me, Myself, and I are Here (talk | contribs) |
Date of latest edit | 04:34, 6 December 2023 |
Total number of edits | 423 |
Recent number of edits (within past 30 days) | 0 |
Recent number of distinct authors | 0 |